Hope Beier, Ph.D.

Program Director

Imaging Technology Development Branch

Dr. Hope Beier is a Program Director in the Imaging Technology Development Branch of the Cancer Imaging Program, Division of Cancer Treatment and Diagnosis at the National Cancer Institute (NCI). Dr. Beier received a Ph.D. in Biomedical Engineering from Texas A&M University in 2009 with a specialization in Biomedical Optics. She then completed a National Research Council postdoctoral fellowship within the Air Force Research Laboratory investigating the impact of high energy laser exposures on mammalian cells using advanced microscopy techniques. She continued this work as a Senior Research Biomedical Engineer at AFRL serving in both Principal Investigator and Program Management roles. While at AFRL, Dr. Beier was awarded the AFRL Early Career Award and the John L. McLucas Award, an annual award recognizing the top Basic Science Researcher in AFRL, for her research focusing on the development of novel optical techniques to understand the basic bioeffects of electromagnetic energy exposure. Just prior to joining NCI, she held the position of Chief Technology Officer for Odin Technologies, a startup focused using optical sensors for perfusion monitoring.